All abstracts by Aaron J. Cavosie at Goldschmidt2017
| (2017) Nanoscale Trace Element Analysis of Zircon via High Spatial Resolution SIMS in a FIB-SEM
Rickard W, Reddy S, Saxey D, Fougerouse D, Cavosie A & Peterman E |
| (2017) Nanoscale Characterization of Shock Twinning in Zircon by EBSD, TKD, TOF-SIMS, TEM, and Atom Probe
Cavosie AJ, Reddy SM, Rickard WDA, Saxey DW, Fougerouse D & Sharp T |