Abstract Details
(2017) Nanoscale Trace Element Analysis of Zircon via High Spatial Resolution SIMS in a FIB-SEM
Rickard W, Reddy S, Saxey D, Fougerouse D, Cavosie A & Peterman E
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06b: Salle 351, Thursday 17th August 08:00 - 08:15
Will D.A. Rickard
View all 8 abstracts at Goldschmidt2017
View abstracts at 4 conferences in series
Steve M. Reddy View all 9 abstracts at Goldschmidt2017 View abstracts at 9 conferences in series
David W. Saxey View all 8 abstracts at Goldschmidt2017 View abstracts at 4 conferences in series
Denise Fougerouse View all 8 abstracts at Goldschmidt2017
Aaron J. Cavosie View all 2 abstracts at Goldschmidt2017 View abstracts at 15 conferences in series
Emily Peterman View all 2 abstracts at Goldschmidt2017 View abstracts at 7 conferences in series
Steve M. Reddy View all 9 abstracts at Goldschmidt2017 View abstracts at 9 conferences in series
David W. Saxey View all 8 abstracts at Goldschmidt2017 View abstracts at 4 conferences in series
Denise Fougerouse View all 8 abstracts at Goldschmidt2017
Aaron J. Cavosie View all 2 abstracts at Goldschmidt2017 View abstracts at 15 conferences in series
Emily Peterman View all 2 abstracts at Goldschmidt2017 View abstracts at 7 conferences in series
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