All abstracts by K Genareau at Goldschmidt 2005
(2005) SIMS Depth-Profiling of Igneous Phenocrysts: Examining Trace Element Variations on the Edge
Genareau K, Roggensack K & Hervig R |
(2005) SIMS Depth-Profiling of Igneous Phenocrysts: Examining Trace Element Variations on the Edge
Genareau K, Roggensack K & Hervig R |