All abstracts by Amy E. Hofmann at Goldschmidt2009
| (2009) New Capabilities for Small-Scale and High-Precision SIMS Analysis
Eiler J, Adkins J, Chapman A, Guan Y, Hofmann A & Ferry J |
| (2009) Sub-Micron Scale Ti Variations in Zircons of Known Provenance
Hofmann AE, Baker MB & Eiler JM |