Abstract Details
(2010) X-Ray Microscopy – A Tool to Study the Nanoworld
Thieme J, Sedlmair J, Gleber S-C, Rieger J, Niemeyer J & Coates J
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17c: 200-B, Tuesday 15th June 19:45 - 20:00
Juergen Thieme
View abstracts at 14 conferences in series
Julia Sedlmair View abstracts at 2 conferences in series
Sophie-Charlotte Gleber
Jens Rieger
Juergen Niemeyer
John D Coates View abstracts at 8 conferences in series
Julia Sedlmair View abstracts at 2 conferences in series
Sophie-Charlotte Gleber
Jens Rieger
Juergen Niemeyer
John D Coates View abstracts at 8 conferences in series
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