Abstract Details
(2018) The Properties of Interfacial Layers Revealed by in situ X-Ray Reflectivity and Vertical Scanning Interferometry
Wild B, Daval D, Micha J-S, Ackerer P & Fernandez-Martinez A
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Poster board 175 in Session 06m, Wednesday 15th August 22:15 - Thursday 16th August 00:15
Bastien Wild
View abstracts at 8 conferences in series
Damien Daval
Jean-Sébastien Micha View abstracts at 2 conferences in series
Philippe Ackerer View abstracts at 7 conferences in series
Alejandro Fernández-Martínez View all 5 abstracts at Goldschmidt2018
Damien Daval
Jean-Sébastien Micha View abstracts at 2 conferences in series
Philippe Ackerer View abstracts at 7 conferences in series
Alejandro Fernández-Martínez View all 5 abstracts at Goldschmidt2018
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