Abstract Details
(2008) C60 TOF-SIMS: A Tool for High-Resolution Mapping of Elements and Organic Compounds
Rost D, Henkel T, King A & Lyon I
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20e: Woodward IRC 3, Friday 18th July 00:15 - 00:30
Detlef Rost
View abstracts at 7 conferences in series
Torsten Henkel View abstracts at 6 conferences in series
Ashley King View abstracts at 5 conferences in series
Ian Lyon View abstracts at 9 conferences in series
Torsten Henkel View abstracts at 6 conferences in series
Ashley King View abstracts at 5 conferences in series
Ian Lyon View abstracts at 9 conferences in series
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