(2017) Nanoscale Characterization of Shock Twinning in Zircon by EBSD, TKD, TOF-SIMS, TEM, and Atom Probe
Cavosie AJ, Reddy SM, Rickard WDA, Saxey DW, Fougerouse D & Sharp T
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06b: Salle 351, Thursday 17th August 09:15 - 09:30 View in program
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